Model: EFT-530

Features:

• Accuracy: ≤1×10-6 (≤1ppm)
• Accurate identification of jewelries
• An optional external beam allows access to the widest variety of high sensitive peripheral sampling system, such as GC/IR interface and FTIR microscope.
• ATR crystal sample holder is easy to operate and change
• Automatic, fast and accurate measurement of oxygen and carbon in silicon crystal
• Compatible PC control with user friendly, rich function software enables easy, convenient and flexible operation. Spectrum collect, spectrum conversion, spectrum collect, spectrum conversion, spectrum processing, spectrum analyzing, and spectrum output function etc. can be performed
• Curve, peak wavelength, stop wavelength and D* etc can be presented
• Direct measurement to IR quartz tube, no need to cut samples
• Easy and accurate measurement of the loss rate of IR optic fiber, overcoming the difficulties for fiber testing , since they are very thin, with very small light-passing holes and uneasy to fix
• Easy operation, no internal adjustment needed
• Easy sample preparation
• Fast accurate measurement of the response of such components as MCT, InSb and PbS etc.
• Fast and accurate measurement of SiO2 powder dust
• Fast change of powder cup
• Fast, convenient and accurate measurement of Hydroxyl content in IR quartz
• For liquid and powder sample analysis
• Fully sealed damp and dust-proof interferometer, adopting high performance, long lifetime sealing material and desiccator, ensures higher adaptability to the environment and increases accuracy and reliability in operation
• High accuracy gold coated optics with less energy losses realize maximum energy efficiency and increase energy output.
• High intensity IR source adopts a reflex sphere to obtain even and stable IR radiation.
• High light throughput
• It is a versatile diffuse reflectance and specular reflectance accessory. Diffuse reflection mode is used for transparent and powder sample analysis. Specular reflection mode is for measuring smooth reflective surface and coating surface.
• Lower detection limit: 1.0×10-6cm-3 (at room temperature)
• Micro samples analysis, minimum sample size: 100μm (DTGS detector) and 20μm (MCT detector)
• Non-destructive sample analysis
• Optical aberration compensation
• Outside IR source design with easy replacement provides higher thermal stability. Stable interference is obtained without the need of dynamic adjustment.
• PC controls the switch over between internal and external light beams to enable the use of special IR accessories such as external IR microscope and GC/IR interface
• Silicon plate thickness:0.1-3.5nm
• Small light spot, able to measure micro samples
• Special silicon plate holder
• Special SiO2 powder dust monitoring software
• The application of programmable gain amplifier, high accuracy A/D converter and embedded computer improves the accuracy and reliability of the whole system.
• The sampling compartment is wide enough for various accessories such as diffused/specular reflection, ATR, Liquid cell, Gas cell, and IR microscope etc.
• The spectrometer connects to PC via a USB port for automatic control and data communication, fully realizing plug-and-play and raising the software flexibility
• Translucent sample analysis
• Two measurement methods: transmission and reflection
• Unique cube-corner Michelson interferometer features not only small size and compact structure but also higher stability and less sensitive to vibrations and thermal variations compared with conventional Michelson interferometer.
• Variable angle of incidence
• Various special IR libraries are available for routine search. Users can also add and maintain the libraries or set up new libraries by themselves
• ZnSe, Ge and KRS-5 ATR crystals are available for choice

Specifications:

Accessories:

Horizontal ATR (Single-reflection and Multi-reflection)

Diffuse/Specular Reflectance Accessory

IR Microscope