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Atomic force microscope

Lab Expo atomic force microscopes offer high-resolution surface imaging capabilities. They have precise laser detection and a sharp probe. They include integrated software for data processing and visualization. They come equipped with a modular electrical system and a CCD observation system. They have automatic scanning and adjusting features. They provide a wide sample transfer range and an optical observation system. Our atomic force microscopes provide enhanced features for precision and ease of operation, ensuring consistent imaging and analysis.

Atomic force microscope 43-ATM100

  • Operation modes : Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
  • Scan angle : Random angle
  • Maximum scan range : X/Y axis: 20 µm, Z axis: 2 µm
  • Optical system/ Magnification of CCD : Magnification: 4x, Resolution: 2.5 µm
$29556

Atomic force microscope 43-ATM101

  • Operation modes : Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360°
  • Scan angle : 0 to 360°
  • Maximum scan range : X/Y axis: 50 µm, Z axis: 5 µm
  • Optical system/ Magnification of CCD : Magnification: 10x, Resolution: 1 µm
$42504