Atomic force microscope comes with combined design of scan head and sample stage, to give strong anti-vibration performance. Adopted with servomotor, drives the sample approaching tip manually or automatically, to evaluate precise scanning area position. Equipped with precision laser detection and probe alignment device, make easy adjustment of laser beam.
Price: $42504
| Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360° |
| Scan angle | 0 to 360° |
| Maximum scan range | X/Y axis: 50 µm, Z axis: 5 µm |
| Optical system/ Magnification of CCD | Magnification: 10x, Resolution: 1 µm |
| Resolution | X/Y axis: 0.2 nm, Z axis: 0.05 nm |
| Sample size | Ø≤ 90 mm, H≤ 20 mm |
| Sample movement | 0 to 20 mm |
| Pulse width of approaching motor | 10 ± 2 ms |
| Scan rate | 0.6 Hz to 4.34 Hz |
| Scanning control | XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously |
| Types of sampling pixel | 256×256, 512×512 |
| Feedback type | DSP digital feedback |
| Feedback sampling rate | 64 KHz |
| PC connections: | USB 2.0 |
| Windows software | Compatible with windows 98/2000/XP/7/8 |
| Instrument Diemnsion | 700 × 500 × 460 mm |
| Net weight | 50 kg |
| Gross Weight | 87.4 kg |
Large sample transfer range
Optical observation system for checking tip & sample’s position
Modular electronic system for easy maintenance
CCD observing system
Equipped with servomotor to achieve CCD auto focusing
Provides highly accurate results
It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.
Captures & display multi-channel images at same time, observes profile map in real-time
Measures multiple curves like F-Z, F-RMS, RMS-Z 3
Execute move & cut functions of scan area, selects an area of interest
Scans sample in 0 to 360° angle range
Adjust laser spot detection system in real time
Selection and setting for different color scanning images in palette
Supports linear average and offset calibration in real time for sample title
Supports scanner sensitivity calibration and electronic controller auto-calibration
Supports offline analysis and process of sample image
