Atomic force microscope

Lab Expo atomic force microscopes offer high-resolution surface imaging capabilities. They have precise laser detection and a sharp probe. They include integrated software for data processing and visualization. They come equipped with a modular electrical system and a CCD observation system. They have automatic scanning and adjusting features. They provide a wide sample transfer range and an optical observation system. Our atomic force microscopes provide enhanced features for precision and ease of operation, ensuring consistent imaging and analysis.