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Comparison Microscope 43-CMS100 Catalog

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Comparison Microscope 43-CMS100

Comparison Microscope 43-CMS100

Overview :

Lab Expo Comparison Microscope 43-CMS100 enables the side-by-side analysis of two specimens by same person. It comes with built in digital colour video recording system to observe a live image of the split image on to the computer. It has large working distance of 100 mm for easy specimen mounting and observing. This microscope is mainstay of forensic science & criminology investigations.

Specifications:
Optical magnification range 2.5X ~ 120X
Eyepiece WF 10X / Ø 22 mm, WF 10X / Ø 14 mm
video recording system 3 mega pixels, 1024 × 768 resolutionSupport USB numerical VGA/AV/DAI outputMatch with digital camera port
Working distance 100 mm
Objective stage dimension 100 mm Moving range: X/50 mm, Y/50 mm, Z/50 mm
Objective 0.6x, 1.2x, 2.0x, 3.5x, 5.0x, (0.3x, 2.0x optical)
Objective view field diameter 2.5 Ø mm-90 Ø mm
Objective stage horizontal linkage range 50 mm
Coarse moving range 50 mm
Illumination Semiconductor light source (brightness adjustable)300W independent exteriorized cold light sourcePhotoconductive fiber with adjustable condenser
Power supply 24 V AV input, 24 V DV stable voltage outputIn accordance with international safe standards
Dimension 410 × 210 × 450 mm
Net weight 7 kg
Gross weight 8 kg

Features:

  • Digital colour video recording system with 3MP resolution
  • Working distance of 100 mm for specimen mounting ease
  • Optical magnification range from 2.5X to 120X capability
  • Power supply: 24V AV input with stable DC output compliance
  • Objective lenses: 0.6x, 1.2x, 2.0x, 3.5x, and 5.0x options
  • Stage movement range: X/50 mm Y/50 mm Z/50 mm precision
  • Eyepiece specification: WF 10X / Ø22 mm and WF 10X / Ø14 mm
  • Illumination system: Semiconductor light source adjustable brightness

Applications:

FunctionImplementationForensic evidence analysis100 mm working distance enables easy specimen mountingCriminology investigations3 mega pixels video recording supports live image observationQuality control labsOptical magnification range 2.5X ~ 120X allows detailed comparisonResearch institutionsSemiconductor light source with adjustable brightness ensures consistent illuminationIndustrial inspection stationsObjective stage horizontal linkage range of 50 mm facilitates specimen alignment

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