Metallurgical Microscope LE-MM404 Catalog

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Overview :

Lab Expo Metallurgical Microscope LE-MM404 is designed with a stable stand structure that ensures precise observation. Equipped with an advanced stage design for smooth, accurate sample positioning. Integrated bright field polarization enhances contrast for clear structural analysis. Incorporated ergonomic design supports long hours of comfortable operation. Our Metallurgical Microscope is widely used in institutes and laboratories.

Specifications:
Optical System

Infinite optical system

Extra Wide Field Eyepiece

WF10X/20

WF10X/20, Eyepiece with Scale of Cross Hair

WF15X/16

WF20X/12

Infinite LWD Plan Achromatic Objective

4X/0.10/∞/0(BF/DF) LWD 20.7mm

10X/0.25/∞/0(BF/DF) LWD 10mm

20X/0.4/∞/0(BF/DF) LWD 5mm

50X/0.75/∞/0(BF/DF) LWD 1.3mm

100X/0.9/∞/0(BF/DF) LWD 0.7mm

Illumination

12V/50W Halogen Light, Center and Brightness Adjustable

Focusing

Coaxial Coarse and Fine Adjustment, Fine Division 2μm, Moving Range (From the Focusing of the Stage Surface) Up 1mm, Down 7mm

Nosepiece

Backward Quintuple Nosepiece

Stage

Double Layer Mechanical Stage 226X178mm, Moving Range 40mmX40mm

Function

Bright Field, Polarization

Features:

  • Backward quintuple nosepiece with five objective positions
  • 12V 50W halogen illumination with center and brightness adjustment
  • Double layer mechanical stage 226x178mm moving range 40x40mm
  • Infinite optical system for corrected image formation
  • Hinged type binocular viewing head with interpupillary adjustment

Applications:

FunctionImplementationMetallurgical analysis4X/0.10 objective LWD 20.7mm enables low-magnification structural inspectionSample examinationMoving range Up 1mm, Down 7mm supports vertical focus adjustment on specimensPolarized light observationBright Field, Polarization function enhances contrast for metallographic studiesStage positioningDouble Layer Mechanical Stage 226X178mm facilitates precise sample manipulationEyepiece selectionWF10X/20 eyepieces provide wide-field viewing for detailed microstructure evaluation

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