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Lab Expo Stereo Microscope LE-SM102 is designed with a fully coated optical system for superior clarity. It delivers true color images with sharp, consistent focus across the entire zoom range. Built-in high-precision optics ensure maximum working distance and large field coverage. Incorporated wide magnification range of 3.35X to 270X with compatible eyepieces and auxiliary lenses. Our Stereo Microscope ideal for inspection, quality control, dissection, and detailed laboratory analysis.
$1,752.00 $ 1460
| Head | Binocular |
| Magnification | 6.7X to 45X, 3.35 to 270X with optional lens |
| Working Distance | 105mm |
| Eyepiece | 10X/22mm |
| Zoom Range | 0.67X to 4.5X |
| Zoom Ratio | 6.7:1 |
| Objective | 0.3X, 0.5X, 0.7X, 0.75X, 1.5X, 2X |
| Diopter Adjustment | ±5 diopters |
| Interpupillary Distance | 54 to 75mm |
| Binocular Tube | with an Inclination of 45° for Greater Ease of Observation |
| Binocular Body | Can be Rotated a Full 360° and Locked in Any Position Desired |
| Focusing Mount | A1 Focusing Bracket, Handwheel's Tightness is Adjustable, Lifting Range 50mm |
| Base | CB1 Base |
| Illumination | Fluorescent Lamp, LED Ring Light, for More Option |
Function Implementation Quality control inspection 0.3X to 2X objective lenses enable detailed component analysis Laboratory dissection work 105mm working distance supports precise specimen manipulation Clinical sample review Binocular tube with 45° inclination reduces observer fatigue Industrial parts verification Zoom range 0.67X to 4.5X allows flexible magnification adjustment Educational training labs Interpupillary distance adjustable from 54 to 75mm accommodates multiple users
Lab Expo Stereo Microscopes are structured around dual optical paths to deliver true three-dimensional visualization with extended depth of field. This stereoscopic microscope supports low-magnification inspection with a wide working distance for hands-on sample handling. Binocular or trinocular configurations, stable illumination, and smooth focus control enable precise surface examination, manipulation, and quality inspection across research, electronics, education, and industrial workflows.
