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Lab Expo Stereo Microscope LE-SM104 is designed with a magnification range from 3.5X to 270X. It offers crystal-clear, high-resolution images with excellent depth and a broad field of view. Equipped with super wide high eye point WF10X/20mm eyepieces, it ensures operator comfort. Integrated optical components provide consistent sharpness, making it ideal for detail work. Our Stereo Microscope is suitable for electronic industry, educational demonstration and agricultural research for micro-object observation, inspection and measurement.
$1,536.00 $ 1280
| Head | Binocular |
| Magnification | 7X to 45X, 3.5 to 270X with optional lens |
| Working Distance | 100mm, 30 to 287mm with optional lens |
| Eyepiece | 10X/20mm |
| Zoom Range | 0.7X to 4.5X |
| Zoom Ratio | 6.4:1 |
| Objective | 0.3X, 0.5X, 0.7X, 0.75X, 1.5X, 2X |
| Diopter Adjustment | ±5 diopters |
| Interpupillary Distance | 54 to 76mm |
| Binocular Tube | with an Inclination of 45° for Greater Ease of Observation |
| Binocular Body | Can be Rotated a Full 360° and Locked in Any Position Desired |
| Focusing Mount | A1 Focusing Bracket, Handwheel's Tightness is Adjustable, Lifting Range 50mm |
| Base | CB1 Base |
| Illumination | Fluorescent Lamp, LED Ring Light, for More Option |
Function Implementation Electronic inspection 0.3X to 2X objectives enable detailed component analysis Educational labs Binocular tube inclined at 45° supports extended observation sessions Agricultural research Magnification up to 270X facilitates micro-organism study Industrial QA Working distance of 100mm allows manipulation during examination Medical training Diopter adjustment ±5 accommodates varying user vision needs
Lab Expo Stereo Microscopes are structured around dual optical paths to deliver true three-dimensional visualization with extended depth of field. This stereoscopic microscope supports low-magnification inspection with a wide working distance for hands-on sample handling. Binocular or trinocular configurations, stable illumination, and smooth focus control enable precise surface examination, manipulation, and quality inspection across research, electronics, education, and industrial workflows.