Request Quote
Scan the QR code below to connect with us on WhatsApp.
Request Quote
Scan the QR code below to connect with us on WhatsApp.
Lab Expo Temperature & Humidity Test Chamber 24-TTC206 can operate from -20°C to 150°C, -40°C to 150°C, or -70°C to 150°C. It has a capacity of 225 liters providing ample space for various testing applications. It features windows with an anti-sweat heater device that prevent condensation and water droplet formation for clear visibility. Our test chamber has an LCD touchscreen for easy control and real-time monitoring of settings.
$37,901.00 $ 31584
| Capacity | 225 L |
| Temperature range | (-20)℃ to 150 ℃ ,(-40) ℃ to 150 ℃ , (-70 )℃ to 150 ℃ |
| Temperature cooling rate | 5 ℃ / min |
| Temperature heating rate | 3 ℃ / min |
| Temperature fluctuations | ± 0.5 ℃ |
| Temperature deviation | ± 2.0 ℃ |
| Humidity range | 20 % to 98 % R.H |
| Humidity deviation | ± 2.5 % RH |
| High temperature | 180 ℃ |
| Lowest humidity | 10 % RH |
| Internal dimension (D x W x H) | 500 x 600 x 750 mm |
| Overall dimension (D x W x H) | 960 x 1150 x 1860 mm |
Function Implementation Stability testing labs Temperature deviation ± 2.0 ℃ ensures consistent environmental conditions Material aging studies Humidity range 20 % to 98 % R.H simulates diverse climatic exposures Pharmaceutical validation Internal dimension 500 x 600 x 750 mm accommodates standard sample trays Quality control batches Capacity 225 L supports high-volume product evaluation cycles Electronics stress screening Temperature heating rate 3 ℃ / min enables controlled thermal ramp-up profiles
Lab Expo Temperature Humidity Test Chamber provides precise environmental control with uniform temperature and humidity distribution for repeatable testing. Designed for research, quality control, and industrial evaluation, this temperature humidity chamber uses forced convection airflow and eco-friendly refrigeration to maintain stable conditions. LCD-based monitoring and durable build support accurate parameter control and consistent performance across extended test cycles.