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Lab Expo Atomic force microscope 43-ATM100 delivers nanoscale surface imaging with 0.2 nm X/Y and 0.05 nm Z resolution, featuring contact, friction, tapping phase, MFM, and EFM modes. It scans samples up to Ø90 mm × H20 mm at rates from 0.6 Hz to 4.34 Hz using DSP digital feedback and USB 2.0 PC connection. Optical CCD system provides 4x magnification with 2.5 µm resolution for tip and sample alignment. Compatible with Windows operating systems for reliable operation in research, quality control, clinical, and industrial laboratories requiring precise topographical and material property analysis at the nanoscale.
$35,438.00 $ 29532
| Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle |
| Scan angle | Random angle |
| Maximum scan range | X/Y axis: 20 µm, Z axis: 2 µm |
| Optical system/ Magnification of CCD | Magnification: 4x, Resolution: 2.5 µm |
| Resolution | X/Y axis: 0.2 nm, Z axis: 0.05 nm |
| Sample size | Ø≤ 90 mm, H≤ 20 mm |
| Sample movement | 0 to 20 mm |
| Pulse width of approaching motor | 10 ± 2 ms |
| Scan rate | 0.6 Hz to 4.34 Hz |
| Scanning control | XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously |
| Types of sampling pixel | 256×256, 512×512 |
| Feedback type | DSP digital feedback |
| Feedback sampling rate | 64 KHz |
| PC connections: | USB 2.0 |
| Windows software | Compatible with windows 98/2000/XP/7/8 |
| Instrument Diemnsion | 415 × 410 × 545 mm |
| Net weight | 40 kg |
| Gross Weight | 50 kg |
Function Implementation Material science labs 0.2 nm X/Y resolution enables nanoscale surface analysis Biological imaging 0.05 nm Z axis resolution supports subcellular structure visualization Quality control inspection Scan rate up to 4.34 Hz allows rapid sample throughput Semiconductor metrology Maximum scan range of 20 µm XY facilitates wafer topography mapping Research laboratories USB 2.0 PC connection enables seamless data transfer and analysis
2 types of sampling pixel for selection (256×256, 512×512)
Selection of an area of interest for sampling by executing scan area move and cut function
Scans sample in random angle at beginning
Adjustment of laser spot detection system in real time
Selection and setting for different color scanning images in palette
Supports linear average and offset calibration in real time for sample title
Supports scanner sensitivity calibration and electronic controller auto-calibration
Supports offline analysis and process of sample image
Lab Expo Atomic Force Microscopes are structured around probe-based surface scanning to capture nanoscale topography with high positional accuracy. This afm microscope uses laser detection with automated scan control to generate repeatable surface measurements. Integrated analysis software, CCD-assisted sample alignment, modular electronics, and wide sample handling capability support stable, high-resolution imaging for nanotechnology, materials research, and advanced analytical workflows.
