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Lab Expo Atomic force microscope 43-ATM101 comes with combined design of scan head and sample stage, to give strong anti-vibration performance. Adopted with servomotor, drives the sample approaching tip manually or automatically, to evaluate precise scanning area position. Equipped with precision laser detection and probe alignment device, make easy adjustment of laser beam.
$50,976.00 $ 42480
| Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360° |
| Scan angle | 0 to 360° |
| Maximum scan range | X/Y axis: 50 µm, Z axis: 5 µm |
| Optical system/ Magnification of CCD | Magnification: 10x, Resolution: 1 µm |
| Resolution | X/Y axis: 0.2 nm, Z axis: 0.05 nm |
| Sample size | Ø≤ 90 mm, H≤ 20 mm |
| Sample movement | 0 to 20 mm |
| Pulse width of approaching motor | 10 ± 2 ms |
| Scan rate | 0.6 Hz to 4.34 Hz |
| Scanning control | XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously |
| Types of sampling pixel | 256×256, 512×512 |
| Feedback type | DSP digital feedback |
| Feedback sampling rate | 64 KHz |
| PC connections: | USB 2.0 |
| Windows software | Compatible with windows 98/2000/XP/7/8 |
| Instrument Diemnsion | 700 × 500 × 460 mm |
| Net weight | 50 kg |
| Gross Weight | 87.4 kg |
Function Implementation Material surface analysis 0.2 nm X/Y resolution enables nanoscale topography mapping Biological sample imaging 0.05 nm Z resolution supports protein structure visualization Semiconductor inspection 50 µm XY scan range allows integrated circuit defect detection Polymer characterization 4.34 Hz max scan rate facilitates dynamic mechanical property testing Quality control labs 256×256 sampling pixel ensures consistent dimensional verification
Captures & display multi-channel images at same time, observes profile map in real-time
Measures multiple curves like F-Z, F-RMS, RMS-Z 3
Execute move & cut functions of scan area, selects an area of interest
Scans sample in 0 to 360° angle range
Adjust laser spot detection system in real time
Selection and setting for different color scanning images in palette
Supports linear average and offset calibration in real time for sample title
Supports scanner sensitivity calibration and electronic controller auto-calibration
Supports offline analysis and process of sample image
Lab Expo Atomic Force Microscopes are structured around probe-based surface scanning to capture nanoscale topography with high positional accuracy. This afm microscope uses laser detection with automated scan control to generate repeatable surface measurements. Integrated analysis software, CCD-assisted sample alignment, modular electronics, and wide sample handling capability support stable, high-resolution imaging for nanotechnology, materials research, and advanced analytical workflows.
