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Atomic force microscope comes with combined design of scan head and sample stage, to give strong anti-vibration performance. Adopted with servomotor, drives the sample approaching tip manually or automatically, to evaluate precise scanning area position. Equipped with precision laser detection and probe alignment device, make easy adjustment of laser beam.
$51,005.00
$42,504.00
Specifications
| Operation modes | Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scan angle 0 to 360° |
| Scan angle | 0 to 360° |
| Maximum scan range | X/Y axis: 50 µm, Z axis: 5 µm |
| Optical system/ Magnification of CCD | Magnification: 10x, Resolution: 1 µm |
| Resolution | X/Y axis: 0.2 nm, Z axis: 0.05 nm |
| Sample size | Ø≤ 90 mm, H≤ 20 mm |
| Sample movement | 0 to 20 mm |
| Pulse width of approaching motor | 10 ± 2 ms |
| Scan rate | 0.6 Hz to 4.34 Hz |
| Scanning control | XY: 18 bit D/A & double 16 bit A/D multiple channel simultaneously |
| Types of sampling pixel | 256×256, 512×512 |
| Feedback type | DSP digital feedback |
| Feedback sampling rate | 64 KHz |
| PC connections: | USB 2.0 |
| Windows software | Compatible with windows 98/2000/XP/7/8 |
| Instrument Diemnsion | 700 × 500 × 460 mm |
| Net weight | 50 kg |
| Gross Weight | 87.4 kg |
Features
Applications
It finds best solution for applications in biochemistry for tissues, cells, cellular components imaging, nanotechnology for imaging of polymers, nanomaterials, and in chemistry physics for imaging of surface metals elements.
Software Features
Captures & display multi-channel images at same time, observes profile map in real-time
Measures multiple curves like F-Z, F-RMS, RMS-Z 3
Execute move & cut functions of scan area, selects an area of interest
Scans sample in 0 to 360° angle range
Adjust laser spot detection system in real time
Selection and setting for different color scanning images in palette
Supports linear average and offset calibration in real time for sample title
Supports scanner sensitivity calibration and electronic controller auto-calibration
Supports offline analysis and process of sample image
Lab Expo atomic force microscopes offer high-resolution surface imaging capabilities. They have precise laser detection and a sharp probe. They include integrated software for data processing and visualization. They come equipped with a modular electrical system and a CCD observation system. They have automatic scanning and adjusting features. They provide a wide sample transfer range and an optical observation system. Our atomic force microscopes provide enhanced features for precision and ease of operation, ensuring consistent imaging and analysis.
