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Lab Expo Stereo Microscope LE-SM103 delivers a high-performance imaging for precise visual inspection. Equipped with a fully coated optical system for enhanced clarity. Integrated zoom optics maintain focus across the entire range. Incorporated magnification flexibility from 3.35X to 270X. Our Stereo Microscope is ideal for both industrial as well as biological research applications.
$1,853.00 $ 1544
| Head | Trinocular |
| Magnification | 6.7X to 45X, 3.35 to 270X with optional lens |
| Working Distance | 105mm, 26 to 287mm with optional lens |
| Eyepiece | 10X/22mm |
| Zoom Range | 0.67X to 4.5X |
| Zoom Ratio | 6.7:1 |
| Objective | 0.3X, 0.5X, 0.7X, 0.75X, 1.5X, 2X |
| Diopter Adjustment | ±5 diopters |
| Interpupillary Distance | 54 to 75mm |
| Trinocular Body | Can be Rotated a Full 360° and Locked in Any Position Desired |
| Focusing Mount | A1 Focusing Bracket, Handwheel's Tightness is Adjustable, Lifting Range 50mm |
| Base | CB1 Base |
| Illumination | Fluorescent Lamp, LED Ring Light, for More Option |
| Trinocular Interface | Fit with Three-Eye Pole and CTV, It Can Be Connected with Ordinary Camera, Digital Camera, Industrial Camera and CCD |
Function Implementation Quality control inspection 10X/22mm eyepiece enables detailed visual assessment Biological research labs 6.7X to 45X magnification supports specimen analysis Industrial manufacturing 3.35 to 270X with optional lens facilitates precision measurement Clinical diagnostics ±5 diopters adjustment allows customized focus settings Educational institutions Trinocular body rotated 360° enables shared viewing and documentation
Lab Expo Stereo Microscopes are structured around dual optical paths to deliver true three-dimensional visualization with extended depth of field. This stereoscopic microscope supports low-magnification inspection with a wide working distance for hands-on sample handling. Binocular or trinocular configurations, stable illumination, and smooth focus control enable precise surface examination, manipulation, and quality inspection across research, electronics, education, and industrial workflows.